Method of computing global-to-local metrics for recognition
US8488873B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 7, 2009 |
| Grant date | Jul 16, 2013 |
| Priority date | — |
| Expiry date | May 16, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/761
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of computing global-to-local metrics for recognition. Based on training examples with feature representations, the method automatically computes a local metric that varies over the space of feature representations to optimize discrimination and the performance of recognition systems.Given a set of points in an arbitrary features space, local metrics are learned in a hierarchical manner that give low distances between points of same class and high distances between points of different classes. Rather than considering a global metric, a class-based metric or a point-based metric, the proposed invention applies successive clustering to the data and associates a metric to each one of the clusters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.