Patent · US Active

Method for determining failure rate of an electrochemical sensor

US8489362B2 · kind B2 · utility

0Cited by
1References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 3, 2010
Grant dateJul 16, 2013
Priority date
Expiry dateOct 14, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/4165
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for determining a failure rate of an electrochemical sensor type for a process, wherein the process is defined by determined values, or value intervals, of a plurality of specified process parameters, and wherein a plurality of defect types is specified for the sensor type, comprising steps as follows: assigning, by means of expert knowledge, a defect rate to each combination of one of the values, or value intervals, of the specified process parameters and one of the specified defect types; and calculating the failure rate of the sensor type according to a calculational specification with application of the defect rates assigned to the combinations of a value, or value interval, of a process parameter and a defect type.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.