Method for determining failure rate of an electrochemical sensor
US8489362B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 3, 2010 |
| Grant date | Jul 16, 2013 |
| Priority date | — |
| Expiry date | Oct 14, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/4165
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining a failure rate of an electrochemical sensor type for a process, wherein the process is defined by determined values, or value intervals, of a plurality of specified process parameters, and wherein a plurality of defect types is specified for the sensor type, comprising steps as follows: assigning, by means of expert knowledge, a defect rate to each combination of one of the values, or value intervals, of the specified process parameters and one of the specified defect types; and calculating the failure rate of the sensor type according to a calculational specification with application of the defect rates assigned to the combinations of a value, or value interval, of a process parameter and a defect type.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.