Patent · US Active

Pattern learning system

US8489522B1 · kind B1 · utility

5Cited by

1References

18Claims

0Family size

Assignee

Raytheon Company · US

Inventors

Michael J. Hirsch · Leipzig, DE
John T. Geiss · Oldsmar, US

Key dates

Filing date	Mar 30, 2010
Grant date	Jul 16, 2013
Priority date	—
Expiry date	Oct 10, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06N20/00
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

According to one embodiment, a pattern learning system includes a pattern learning tool that receives event messages in a sequential manner from multiple sensors and forms multiple sub-sequences that each includes a trigger event message, a consequence event message, and one or more intermediary event messages. The pattern learning tool then generates multiple graphs that each represents a sub-sequence of the plurality of event messages. The pattern learning tool then combines the graphs into a combined graph according to a type of each event message, and determines a causal sequence from the combined graph according to a heaviest weighted directed path from the trigger event message to the consequence event message.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.