In-situ gas analyzer probe
US8490506B2 · kind B2 · utility
0Cited by
1References
27Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 7, 2010 |
| Grant date | Jul 23, 2013 |
| Priority date | — |
| Expiry date | Sep 7, 2031 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC01B17/0456
- WIPO fieldMaterials, metallurgy
- WIPO sectorChemistry
Abstract
A probe mounted directly to a conduit conveying a process stream of gas to be analyzed, which can condition a continuous sample of the gas before it is analyzed by removing undesirable vapor components of the sample through interaction with a heat exchanger conduit which condenses these components into a liquid such that they precipitate under the force of gravity back into the process stream. The probe uses a Venturi device to motivate the gas through a flow cell chamber where it interacts with light shown through the chamber before ejecting the sample back into the process stream through a sample return conduit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.