Patent · US Active

Device for testing an electrical component

US8494803B2 · kind B2 · utility

4Cited by

1References

16Claims

0Family size

Assignee

dSPACE digital signal processing and control engineering GmbH · DE

Inventors

Dirk Hasse · Paderborn, DE
Peter Scheibelhut · Paderborn, DE
Dirk Bittner · Langenhagen, DE
Robert Polnau · Paderborn, DE

Key dates

Filing date	Oct 8, 2010
Grant date	Jul 23, 2013
Priority date	—
Expiry date	Aug 23, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG05B2219/23446
WIPO fieldControl
WIPO sectorInstruments

Abstract

A device for testing an electrical component is provided, having a simulation device for generating a simulation signal, a testing device for connecting the electrical component, at least two connecting devices, and a selection device for selecting the connecting device, wherein the simulation device and the testing device can be connected in an electrically conducting manner to at least one of the connecting devices by the selection device and the individual connecting devices differ from one another in at least one electrical property. Thus, a device for testing an electrical component is provided with which in a simple manner the testing accuracy can be increased by minimizing the signal corruption due to a parasitic property of the connecting device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.