Pick and place apparatus for electronic device inspection equipment, picking apparatus thereof, and method for loading electronic devices onto loading element
US8496426B2 · kind B2 · utility
4Cited by
7References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 7, 2010 |
| Grant date | Jul 30, 2013 |
| Priority date | — |
| Expiry date | Nov 26, 2031 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S901/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A technology related to a pick-and-place apparatus for electronic device inspection equipment is provided. The pick-and-place apparatus includes the guiding unit that can interact with a loading element and can guide the picker to load the electronic devices at a correct position on the loading element. Therefore, the pick-and-place apparatus can allow the electronic devices, for example, semiconductor devices having a ball type of electrical contact lead (BGA, FBGA, etc.), to electrically contact the tester in a stable manner when the tester inspects the electronic devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.