III-V nitride semiconductor device comprising a diamond layer
US8497513B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2009 |
| Grant date | Jul 30, 2013 |
| Priority date | — |
| Expiry date | Aug 17, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/308
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a semiconductor device, in particular to a chemical field effect transistor (ChemFET), a high-electron mobility transistor (HEMT) and an ion-sensitive field effect transistor (ISFET), as well as a method for manufacturing the same. The semiconductor device comprises a structure, the structure comprises a substrate, a first layer comprising GaN and a second layer comprising InAlN, wherein the first and the second layer are arranged parallely to each other on the substrate, and wherein the structure comprises a third layer comprising diamond.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.