Imaging apparatus

US8498377B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Franz Fadler · Hetzles, DE
• Robert Fasbender · Ottobrunn, DE
• Armin Fürst · Erlangen, DE
• Burkhard Groh · Chicago, US
• Reiner Schulz · Remscheid, DE
• Kaiss Shanneik · Erlangen, DE

Key dates

• Filing date: Dec 1, 2010
• Grant date: Jul 30, 2013
• Expiry date: Sep 5, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/612
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An imaging apparatus for irradiating an object includes a source arrangement, from which x-rays from different positions that form an at least one-dimensional structure may be emitted. The imaging apparatus also includes a detector arrangement for detecting the x-rays. An object is positioned between the source arrangement and the detector arrangement so that, with the detector arrangement, the x-rays attenuated by the object are recorded. The imaging apparatus also includes an evaluation apparatus for evaluating the signals recorded by the detector arrangement. A region of the detector arrangement is assigned to different positions of the structure, from which x-rays are directed at the region in partial irradiations. The region is aligned relative to the structure, such that the partial irradiations that are produced from the different positions of the structure with a region of the detector develop a radiation geometry that irradiates the object in a planar fashion.