Optimized multi frequency PIM tester topology
US8498582B1 · kind B1 · utility
25Cited by
1References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 26, 2010 |
| Grant date | Jul 30, 2013 |
| Priority date | — |
| Expiry date | Jun 13, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/103
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
In accordance with an embodiment, a system for measuring passive intermodulation (PIM), comprises a base unit, which includes frequency-independent components, and a frequency-dependent plugin, which includes frequency-dependent components and is associated with a particular frequency band. The frequency-dependent plugin can be combined with the base unit to measure PIM over the particular frequency band.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.