Semiconductor device, semiconductor device testing method, and data processing system
US8498831B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 8, 2010 |
| Grant date | Jul 30, 2013 |
| Priority date | — |
| Expiry date | Oct 11, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/13091
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
To include one or a plurality of internal signal lines that electrically connects an interface chip to a core chip. The interface chip includes a first circuit that outputs a current to an internal wiring and the core chip includes a second circuit that outputs a current to the first internal signal line. The interface chip includes a determination circuit that has a first input terminal connected to the internal wiring through which the current outputted by the first circuit flows and a second input terminal connected to an end of the first internal signal line in the interface chip, and outputs a voltage according to a potential difference between a voltage of the first input terminal and a voltage of the second input terminal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.