System and method for detecting thermographic anomalies
US8498836B2 · kind B2 · utility
11Cited by
2References
20Claims
0Family size
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Inventor
Key dates
| Filing date | Nov 26, 2008 |
| Grant date | Jul 30, 2013 |
| Priority date | — |
| Expiry date | Sep 27, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2005/0077
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A thermographic analysis method and apparatus is provided. The method includes obtaining base-line and operational thermographic profiles of a subject area, calculating a difference profile from the base-line and operational thermographic profiles, and providing an indication from the difference profile. The indication may be also based on thermographic differences in portions of the subject area that are defined as thermographic zones.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.