Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations
US8504882B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 17, 2010 |
| Grant date | Aug 6, 2013 |
| Priority date | — |
| Expiry date | Sep 29, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/267
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated circuit (“IC”) includes circuitry for use in testing a serial data signal. One such IC includes circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. One such IC also includes circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. Such an IC provides output signals indicative of results of its operations. One such IC operates in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.