Method for providing reference data for a diagnosis of a system dependent on an event trace
US8505035B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 28, 2008 |
| Grant date | Aug 6, 2013 |
| Priority date | — |
| Expiry date | Mar 20, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/261
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is disclosed. In at least one embodiment, the method includes providing a system specification of the system; deriving a number N1 of base patterns dependent on the system specification, a base pattern representing at least one service and having a number N2 of parameterisable events and a parameterisable control section representing a control flow and/or a data flow between the events; selecting a number N3, wherein N3≦N1, of base patterns and providing a control structure representing a control flow and/or a data flow between the selected base patterns dependent on an event trace expected as a result of the system run; and providing the reference data having at least the selected base patterns and the provided control structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.