Method for detecting defect in material and system for the method
US8506159B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 17, 2008 |
| Grant date | Aug 13, 2013 |
| Priority date | — |
| Expiry date | Sep 17, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A defect on the surface or in the surface layer of a moving material can be detected by using a method comprising steps of: heating the surface of the material, obtaining thermal image data of the surface of the material using an infrared thermography camera while the surface of the material is being heated up at the heating step or being cooled down after heating, and detecting the defect by calculating Laplacian with respect to temperature of the surface represented by the thermal image data. When the thermal image data is obtained while the material is being heated up, a heating device and the camera is arranged so that thermal energy emitted from the heating device is reflected by the material to come into the camera.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.