Variational modeling with discovered interferences
US8510087B2 · kind B2 · utility
1Cited by
9References
20Claims
0Family size
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Key dates
| Filing date | Sep 29, 2010 |
| Grant date | Aug 13, 2013 |
| Priority date | — |
| Expiry date | Dec 15, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system, method, and computer readable medium. A method includes receiving a geometric model in an initial state including at least a first feature and a second feature, at least one of the first and second features being a removal feature. The method includes detecting an interaction between the first and second features, and applying a dependency rule to the first feature and the second feature. The method includes performing a variational edit process including removing the first feature and the second feature according to the dependency rule. The method includes solving and recreating the edited model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.