Patent · US Active

Microelectromechanical structure (MEMS) monitoring

US8513948B2 · kind B2 · utility

0Cited by
7References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 22, 2010
Grant dateAug 20, 2013
Priority date
Expiry dateOct 1, 2031

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81B2203/0118
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A MEMS component is monitored to determine its status. Sensors are deployed to sense the MEMS component and produce detection signals that are analyzed to determine the MEMS component state. An indicator device alerts a user of the status, particularly if the MEMS component has failed. Additionally, the MEMS component monitoring system may be practiced as a design structure encoded on computer readable storage media as part of a circuit design system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.