Probe for a capacitive sensor device and gap-measuring system
US8513960B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 20, 2009 |
| Grant date | Aug 20, 2013 |
| Priority date | — |
| Expiry date | Oct 21, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for a capacitive sensor device, and a gap measuring system using the probe, is disclosed. The probe has a probe head including a measuring element with at least one measuring and front face, a first electrically non-conductive isolator element, and a first partial element of a first shield. The measuring and front face, the first isolator element, and the first partial element of the first shield are adhesively connected to one another and configured as a multilayer, where the first isolator element is disposed between the measuring element with its measuring and front face and the first partial element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.