Patent · US Active

Probe for a capacitive sensor device and gap-measuring system

US8513960B2 · kind B2 · utility

4Cited by
8References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 20, 2009
Grant dateAug 20, 2013
Priority date
Expiry dateOct 21, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B7/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe for a capacitive sensor device, and a gap measuring system using the probe, is disclosed. The probe has a probe head including a measuring element with at least one measuring and front face, a first electrically non-conductive isolator element, and a first partial element of a first shield. The measuring and front face, the first isolator element, and the first partial element of the first shield are adhesively connected to one another and configured as a multilayer, where the first isolator element is disposed between the measuring element with its measuring and front face and the first partial element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.