X-ray dark-field imaging system and method

US8515002B2 · kind B2 · utility

Assignees

• TSINGHUA UNIVERSITY · CN
• NUCTECH COMPANY LIMITED · CN

Inventors

• Zhifeng Huang · Pleasanton, US
• Zhiqiang Chen · Beijing, CN
• Li Zhang · Beijing, CN
• Zhentian Wang · Brugg, CH
• Yuxiang Xing · Beijing, CN
• Ziran Zhao · Beijing, CN
• Yongshun Xiao · Beijing, CN

Key dates

• Filing date: Jul 6, 2010
• Grant date: Aug 20, 2013
• Expiry date: Oct 13, 2030

Classification

• Technology area (CPC G): Physics
• CPC primary: G21K2207/005
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An x-ray imaging technology, performing an x-ray dark-field CT imaging of an examined object using an imaging system which comprises an x-ray source, two absorbing gratings G1 and G2, an x-ray detector, a controller and a data processing unit, comprising the steps of: emitting x-rays to the examined object; enabling one of the two absorbing gratings G1 and G2 to perform phase stepping motion within at least one period range thereof; where in each phase stepping step, the detector receives the x-ray and converts it into an electric signal; wherein through the phase stepping of at least one period, the x-ray intensity at each pixel point on the detector is represented as an intensity curve; calculating a second moment of scattering angle distribution for each pixel, based on a contrast of the intensity curve at each pixel point on the detector and an intensity curve without presence of the examined object; taking images of the object at various angles, then obtaining an image with scattering information of the object in accordance with a CT reconstruction algorithm.