Method and system for determining a quality measure for an image using a variable number of multi-level decompositions
US8515181B2 · kind B2 · utility
4Cited by
6References
43Claims
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Key dates
| Filing date | Oct 17, 2010 |
| Grant date | Aug 20, 2013 |
| Priority date | — |
| Expiry date | Mar 31, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method and system for determining a measure of quality for images are presented. Multi-level decomposition of images in the wavelet domain using a variable number of levels of decomposition and aggregation of selected subbands is performed to obtain an accurate measure of quality. The processing time is reduced in comparison to that required by other methods for generating measures of quality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.