Patent · US Active

Characterization of nonlinear cell macro model for timing analysis

US8515725B2 · kind B2 · utility

2Cited by
2References
25Claims
0Family size

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Inventors

Key dates

Filing dateDec 2, 2010
Grant dateAug 20, 2013
Priority date
Expiry dateSep 29, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2111/08
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system, method and computer program product for modeling a semiconductor device structure. The system and method implemented includes performing a simulation of the circuit by applying at least one input waveform on a circuit input port, and loading an output port with at least one of output load; determining, at successive time steps of the circuit simulation, a voltage value Vi on the input port, a voltage value Vo on the output port, and a current values (ia) and (ib) on the respective input and output ports. Then there is computed from the respective current value for each successive time step of the simulation, at least one charge value (Qa(Vi, Vo)) and (Qb(Vi, Vo)), respectively, as a function of Vi and Vo voltage values; and generating a nonlinear charge source from the at least one charge value, the nonlinear charge source used in modeling a dynamic behavior of the cell. A voltage controlled charge source (VCCS) is thereby determined by capturing the natural digital circuit cell behavior.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.