Image quality monitor for digital radiography system
US8519348B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2009 |
| Grant date | Aug 27, 2013 |
| Priority date | — |
| Expiry date | Feb 23, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10116
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system for monitoring the state of calibration of a digital x-ray detector having a solid state sensor with a plurality of pixels, a scintillating screen and at least one embedded microprocessor, the system having means for capturing a digital image and a computer operable during normal diagnostic use of the detector, in cooperation with at least one embedded microprocessor, for performing pixelwise computations on the image and calculating a misregistration metric indicative of movement of the solid state sensor relative to the scintillating screen. A defect metric indicative of abnormal properties of pixels in the solid state sensor is calculated. It is then determined whether one or both of the misregistration metric and the defect metric exceeds a respective, preselected threshold value. The user of the system is alerted to conduct a calibration of the detector when either one or both of the respective threshold values have been exceeded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.