Method and apparatus for testing projected capacitance matrices and determining the location and types of faults
US8519722B1 · kind B1 · utility
32Cited by
9References
21Claims
0Family size
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Key dates
| Filing date | Oct 22, 2009 |
| Grant date | Aug 27, 2013 |
| Priority date | — |
| Expiry date | Apr 3, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0443
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system and apparatus is described for measuring a sensor, comparing measured values of a sensor to a reference value, adjusting a calibration parameter in response to the comparing of measured values to a reference value and determining sensor integrity based on the value o the adjusted parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.