Device and method for obtaining three-dimensional object surface data
US8520058B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2012 |
| Grant date | Aug 27, 2013 |
| Priority date | — |
| Expiry date | May 4, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2509
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The concept includes projecting at the object surface, along a first optical axis, two or more two-dimensional (2D) images containing together one or more distinct wavelength bands. The wavelength bands vary in intensity along a first image axis, forming a pattern, within at least one of the projected images. Each projected image generates a reflected image along a second optical axis. The 3D surface data is obtained by comparing the object data with calibration data, which calibration data was obtained by projecting the same images at a calibration reference surface, for instance a planar surface, for a plurality of known positions along the z-axis. Provided that the z-axis is not orthogonal to the second optical axis, the z-axis coordinate at each location on the object surface can be found if the light intensity combinations of all predefined light intensity patterns are linearly independent along the corresponding z-axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.