User designated measurement display system and method for NDT/NDI with high rate input data
US8521457B2 · kind B2 · utility
2Cited by
21References
21Claims
0Family size
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Key dates
| Filing date | Oct 20, 2008 |
| Grant date | Aug 27, 2013 |
| Priority date | — |
| Expiry date | Jun 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/90
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A user configured measurement display system and method for a non-destructive testing device and instrument (NDT/NDI) with high input data rate is disclosed. The system and the method provide the means for NDT/NDI instruments display measurement values that satisfies user designated measurement criterion occurring during any measurement time intervals (MTIs). The present disclosure overcomes the shortcomings of conventional ways of picking and displaying measurement values at fixed MTIs, by which the values truly satisfying the measurement criterion that occurs at random MTIs (other than scheduled MTIs) are often skipped.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.