Patent · US Active

Process and system for fabrication of patterns on a surface

US8524100B2 · kind B2 · utility

0Cited by
9References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 3, 2009
Grant dateSep 3, 2013
Priority date
Expiry dateJul 3, 2029

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24802
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

The invention provides a system and process of patterning structures on a carbon based surface comprising exposing part of the surface to an ion flux, such that material properties of the exposed surface are modified to provide a hard mask effect on the surface. A further step of etching unexposed parts of the surface forms the structures on the surface. The inventors have discovered that by controlling the ion exposure, alteration of the surface structure at the top surface provides a mask pattern, without substantially removing any material from the exposed surface. The mask allows for subsequent ion etching of unexposed areas of the surface leaving the exposed areas raised relative to the unexposed areas thus manufacturing patterns onto the surface. For example, a Ga+ focussed ion beam exposes a pattern onto a diamond surface which produces such a pattern after its exposure to a plasma etch. The invention is particularly suitable for patterning of clear well-defined structures down to nano-scale dimensions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.