Patent · US Active

Method for separating a semiconductor layer from a substrate by irradiating with laser pulses

US8524573B2 · kind B2 · utility

1Cited by
30References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 27, 2004
Grant dateSep 3, 2013
Priority date
Expiry dateJan 4, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/018
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for producing a semiconductor component, in which a semiconductor layer is separated from a substrate by irradiation with laser pulses, the pulse duration of the laser pulses being less than or equal to 10 ns. The laser pulses have a spatial beam profile with a flank slope is chosen to be gentle enough to prevent cracks in the semiconductor layer that arise as a result of thermally induced lateral stresses during the separation of semiconductor layer and substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.