System and apparatus for improved low reflectance color measurement
US8525997B1 · kind B1 · utility
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1References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 30, 2012 |
| Grant date | Sep 3, 2013 |
| Priority date | — |
| Expiry date | May 10, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/524
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and system for providing a solution that enables technicians or other technical professionals obtain an accurate color value for a sample regardless of the reflectance properties. The present invention allows for the generation of high precision reflectance information using improved composite measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.