Test systems with multiple antennas for characterizing over-the-air path loss
US8527229B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2010 |
| Grant date | Sep 3, 2013 |
| Priority date | — |
| Expiry date | Jan 6, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B7/0608
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with multiple antennas, and radio-frequency (RF) cables that connect the test unit to the multiple antennas within the test chamber. Reference devices under test (DUTs) may be used to calibrate the OTA path loss of each test station while switching one of the multiple antennas into use one at a time at desired frequencies. A preferred antenna list indicating the preferred antenna that provides the optimal path loss for each desired frequency may be generated. Once calibrated, the test stations may be used during product testing to test factory DUTs to determine whether a particular production DUT satisfies pass/fail criteria. During product testing, a selected one of the multiple antennas is enabled based on the preferred antenna list to perform desired measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.