Pattern identification method, parameter learning method and apparatus
US8527439B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 5, 2008 |
| Grant date | Sep 3, 2013 |
| Priority date | — |
| Expiry date | May 24, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/764
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a pattern identification method in which input data is classified into predetermined classes by sequentially executing a combination of a plurality of classification processes, at least one of the classification processes includes a mapping step of mapping the input data in an N (N≧2) dimensional feature space as corresponding points, a determination step of determining whether or not to execute the next classification process based on the corresponding points, and selecting step of selecting a classification process to be executed next based on the corresponding points when it is determined in the determination step that the next classification process should be executed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.