Patent · US Active

Downhole instrument calibration during formation survey

US8528381B2 · kind B2 · utility

10Cited by
8References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 13, 2009
Grant dateSep 10, 2013
Priority date
Expiry dateNov 13, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V13/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A downhole sensor calibration apparatus includes a rotational or gimbaling mechanism for guiding a sensing axis of an orientation responsive sensor through a three-dimensional orbit about three orthogonal axes. A method includes using measurements taken over the three-dimensional orbit to calibrate the sensor and determine other characteristics of the sensor or tool.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.