Patent · US Active

Method and device for determining the thickness of material using high frequency

US8531329B2 · kind B2 · utility

5Cited by

22References

11Claims

0Family size

Assignee

Robert Bosch GmbH · DE

Inventors

Michael Mahler · Echterdingen, DE
Ulli Hoffmann · Mühlacker, DE
Reiner Krapf · Reutlingen, DE
Christoph Wieland · Bukit Mertajam, MY
Felix Wewers · Leverkusen, DE

Key dates

Filing date	Jun 9, 2005
Grant date	Sep 10, 2013
Priority date	—
Expiry date	Jun 11, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01B7/10
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention relates to a method for determining the thickness of material by penetrating the material, in particular a method for measuring the thickness of walls, ceilings and floors, with which a measurement signal (28) in the gigahertz frequency range emitted using a high-frequency transmitter (24) penetrates the material (10) to be investigated at least once and is detected by a high-frequency receiver (38).According to the present invention, it is provided that the thickness (d) of the material (10) is measured via at least two transit-time measurements of the measurement signal (28) performed at various positions (20, 22) of the high-frequency transmitter (24) and/or the high-frequency receiver (34).The present invention also relates to a device system (12; 40, 140, 240, 340) for carrying out the method described above.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.