Focusing and focus metrics for a plenoptic imaging system
US8531581B2 · kind B2 · utility
35Cited by
16References
20Claims
0Family size
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Key dates
| Filing date | May 23, 2011 |
| Grant date | Sep 10, 2013 |
| Priority date | — |
| Expiry date | May 23, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/957
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Metrics for characterizing the focusing of a plenoptic imaging system. In one aspect, the metric is based on the high frequency content and/or the blurring of the plenoptic image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.