Apparatus for absolute variable angle specular reflectance measurements
US8531673B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 21, 2011 |
| Grant date | Sep 10, 2013 |
| Priority date | — |
| Expiry date | Jul 18, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/55
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring specular reflectance of a sample is provided including a light source for transmitting a beam of light at an angle of incidence onto a surface of a sample; a polarizing filter comprising a wire grid that avoids a need for collimation of the incident beam of light; a sample holder for mounting the sample; and a detector assembly for detecting a beam of light which is specularly reflected from a surface of the sample; wherein the sample holder and detector assembly are mounted for relative movement, such that the light source, the detector assembly and the sample holder are relatively positionable for a specularly reflected component of a transmitted light beam to be detected for different angles of incidence of the light beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.