Patent · US Active

Method for determining the projection geometry of an x-ray apparatus

US8532258B2 · kind B2 · utility

26Cited by

3References

10Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Clemens Bulitta · Spardorf, DE
Rainer Graumann · Annaberg-Buchholz, DE

Key dates

Filing date	Oct 6, 2010
Grant date	Sep 10, 2013
Priority date	—
Expiry date	Apr 12, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30244
WIPO fieldMedical technology
WIPO sectorInstruments

Abstract

In a method for determining the projection geometry of an x-ray apparatus, an x-ray image of an object inside the patient is generated using the x-ray apparatus. A first measurement of a characteristic dimension of the imaged object is determined in the x-ray image. A second measurement of the characteristic dimension is determined using real geometry data of the object. The projection geometry is then determined using the first and second measurements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.