Method and system for determining structural similarity between images
US8532396B2 · kind B2 · utility
8Cited by
5References
20Claims
0Family size
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Key dates
| Filing date | Dec 3, 2012 |
| Grant date | Sep 10, 2013 |
| Priority date | — |
| Expiry date | Dec 3, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method and system for low complexity assessment of quality of an image are presented. By performing multiresolution decomposition of images using, for example, a discrete wavelet transform, and determining a metric based on a structural similarity index or a structural similarity map, a structural similarity score, characterizing similarity between images with a high degree of accuracy, is produced. The processing time is much smaller in comparison to that required by other methods producing image quality metrics of comparable accuracy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.