Detection device
US8536533B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2008 |
| Grant date | Sep 17, 2013 |
| Priority date | — |
| Expiry date | Jul 31, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V8/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Reflective means comprising substrates, selectively reflects electromagnetic radiation whose frequency lies between 3×109 Hz and 1013 Hz, and includes, for example, a layer of high resistivity silicon, on which the radiation is arranged to be incident, and means for selectively generating charge carriers in the layer to reflect the radiation, for example, by illuminating a face of the substrate with electromagnetic radiation whose wavelength lies between 5 μm and 100 mn in order to generate the charge carriers. The reflective means may form part of an imaging device in which a scene to be imaged is illuminated by radiation which passes through the reflective means in a coaxial arrangement, the reflected radiation being received by the reflective element while the reflective region is scanned over its entire surface, to produce a stream of radiation reflected from the scene which can be detected and used to drive a display. Noise produced by reflection from areas of the reflective means other than the scanned spot may be reduced by crossed polarizers, and the substrates may be grooved to form the polarizers, as well as to simplify the scanning arrangement. Other applications are for…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.