Patent · US Active

Apparatus and a method of determining the presence of an alumina layer on a surface of a component

US8536544B2 · kind B2 · utility

0Cited by
4References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2010
Grant dateSep 17, 2013
Priority date—
Expiry dateOct 19, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/8422
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Provided is a method for determining the presence of an alumina layer on a surface of a component. The method includes illuminating a surface of a component with radiation; detecting radiation emitted at a particular wavelength; analyzing the detected radiation; to determine the thickness of the alumina at at least one point on the surface of the component; and comparing the determined thickness of the alumina at the at least one point on the surface of the component with a predetermined thickness of alumina at that point to decide if the thickness of alumina at the at least one point on the surface of the component is satisfactory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.