System and method for instrument response correction based on independent measurement of the sample
US8537354B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 11, 2011 |
| Grant date | Sep 17, 2013 |
| Priority date | — |
| Expiry date | Nov 8, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/1293
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for providing an instrument response correction. A sample is illuminated to generate a first plurality and a second plurality of interacted photons. The first plurality of interacted photons may be detected by a dispersive spectrometer to generate a reference spectrum representative of the sample. The second plurality of interacted photons may be passed through a tunable filter and detected using an imaging detector to generate at least one hyperspectral image. This hyperspectral image may comprise a Raman hyperspectral image or an infrared hyperspectral image. A system may comprise an illumination source, a collection optics, a dispersive spectrometer, a fiber optic, a tunable filter, and an imaging detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.