Method and apparatus for determining micro-reflections in a network
US8537972B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2006 |
| Grant date | Sep 17, 2013 |
| Priority date | — |
| Expiry date | Sep 22, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
The presence of micro-reflections is determined in a network by determining micro-reflections from amplifier and diplex filter impedance mismatches and micro-reflections from drop cable impedance mismatches. The micro-reflections from impedance mismatches are determined by instructing network element to transmit a test signal at a first symbol rate and a first resolution for amplifier and diplex filter impedance mismatches and a second frequency with a second symbol rate and second resolution for micro-reflections from drop cable impedance mismatches. The tests are performed with several frequencies and the channels with the least micro-reflections are identified.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.