Correction of blotches in component images
US8538194B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 16, 2012 |
| Grant date | Sep 17, 2013 |
| Priority date | — |
| Expiry date | Apr 16, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Blotches may be identified and processed to reduce or eliminate the blotch. The blotch may be in just one of several separations and multiple separations may be used, for example, to identify the blotch. An implementation (i) compares a first component image of an image with a first component image of a reference image, (ii) compares a second component image of the image with a second component image of the reference image, and (iii) determines based on these comparisons whether the first component image of the image includes a blotch. Multiple image separations also, or alternatively, may be used, for example, to modify the blotch, as well as to evaluate whether a modification is beneficial.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.