Patent · US Active

Managing device wearout using I/O metering

US8539139B1 · kind B1 · utility

28Cited by
4References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 17, 2010
Grant dateSep 17, 2013
Priority date—
Expiry dateDec 28, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F13/28
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The number of writes to a device (“D1-n”) consisting of n sub-devices (“Da”) is counted:where: where:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.