Semiconductor storage device, nonvolatile semiconductor memory test method, and medium
US8539315B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 4, 2012 |
| Grant date | Sep 17, 2013 |
| Priority date | — |
| Expiry date | Sep 4, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to one embodiment, a semiconductor storage device includes a nonvolatile semiconductor memory and a controller. The nonvolatile semiconductor memory includes a firmware area capable of storing firmware used to execute either a normal mode or an autorun test mode and a user area capable of storing user data. The controller reads the firmware from the nonvolatile semiconductor memory and determines whether the firmware has been set in either the normal mode or the autorun test mode. The controller repeats erasing, writing, and reading in each block in the user area using a cell applied voltage higher than a voltage used in a normal mode, and enters a block where an error has occurred as a bad block.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.