Probe card
US8542027B2 · kind B2 · utility
1Cited by
4References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 17, 2010 |
| Grant date | Sep 24, 2013 |
| Priority date | — |
| Expiry date | Jul 22, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31928
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe card is provided. The probe card can serialize, analogize and divide a digital signal by a analog-to-digital converter (ADC), a digital-to-analog converter (DAC), and a power divided unit respectively. The probe card can increase signal channels, and is not restricted by signal channels of a tester to test more DUTs simultaneously. Moreover, the probe card has fine impedance matching and channels separating to raise testing efficiency and reduce signal loss.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.