Inspection circuit, electro-optic device, and electronic apparatus
US8542028B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 17, 2009 |
| Grant date | Sep 24, 2013 |
| Priority date | — |
| Expiry date | Mar 24, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2310/0297
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An inspection circuit for inspecting an electro-optic device that includes a data line, a scanning line, a pixel portion, a driving circuit, and a first terminal portion through which a first power supply voltage is supplied to the driving circuit. The inspection circuit includes an inspection line electrically connected to an inspection unit inspecting the pixel portion, a connection circuit electrically connecting the inspection line to the data line, and a supply circuit supplying a control signal for controlling conduction between the data line and the inspection line to the connection circuit. The supply circuit is driven using a second power supply voltage supplied through a second terminal portion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.