System for measuring sample pore using computed tomography and standard sample and method thereof
US8542793B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2011 |
| Grant date | Sep 24, 2013 |
| Priority date | — |
| Expiry date | Sep 30, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/649
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a system for measuring a sample pore using a computed tomography (CT) and a standard sample and to a method thereof, more particularly to a system for measuring a sample pore using a computed tomography (CT) and a standard sample and to a method thereof, wherein the number of pixels in the count range of a cross-sectional image of the measurement sample and the number of pixels corresponding to the gray level range of the pore are calculated with reference to the count range utilized in the cross-sectional image of the standard sample and the gray level range of the pore so as to accurately measure the porosity of the measurement sample after performing a CT scan of the standard sample and the measurement sample together using a CT scanner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.