Methods and systems for enhancing backscatter X-ray foreign object debris detection
US8542876B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 28, 2011 |
| Grant date | Sep 24, 2013 |
| Priority date | — |
| Expiry date | Dec 8, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting an anomaly associated with a structure is described. The method includes obtaining a baseline scan of the structure, changing at least one condition associated with the structure which is intended to impart a movement of the structure or a movement of objects within the structure, obtaining a secondary scan of the structure, the secondary scan obtained from a same position, with respect to the structure, as the baseline scan, determining any differences between the baseline scan and the secondary scan, and identifying at least one of a foreign object proximate the structure and a structural anomaly associated with the structure based on any differences between the baseline scan and the secondary scan.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.