Early detection of lead failure using an impedance histogram
US8543206B2 · kind B2 · utility
4Cited by
2References
39Claims
0Family size
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Key dates
| Filing date | Jun 25, 2010 |
| Grant date | Sep 24, 2013 |
| Priority date | — |
| Expiry date | Nov 22, 2031 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61N1/37
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
Testing lead conditions in an implantable medical device includes continuously sampling the impedance values of a lead associated with the implantable medical device. The sampling is conducted over a predetermined period of time. An impedance histogram is then generated using the sampled impedance values by separating each measured impedance value into a specific bin assigned to contain a particular range of impedance levels. The lead condition of the tested lead can then be determined based on one or more characteristics of the impedance histogram.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.