Patent · US Active

Force measurement system having a plurality of measurement surfaces

US8544347B1 · kind B1 · utility

107Cited by
18References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 11, 2012
Grant dateOct 1, 2013
Priority date
Expiry dateJan 11, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M1/122
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A force measurement assembly includes a first component supported by a first load measuring device and having a first measurement surface; a second component supported by a second load measuring device, spaced apart from the first component by a gap, and having a second measurement surface; and a third load measuring device operatively coupled to both the first component and the second component; wherein the first load measurement device is configured to output at least one first quantity that is representative of the load being applied to the first measurement surface, the second load measurement device is configured to output at least one second quantity that is representative of the load being applied to the second measurement surface, and the third load measuring device is configured to output at least one third quantity that is representative of a load being transferred between the first component and the second component.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.