Learning apparatus and object detecting apparatus
US8548260B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 16, 2009 |
| Grant date | Oct 1, 2013 |
| Priority date | — |
| Expiry date | Nov 16, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/764
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Feature values calculated from a peripheral image area of feature points extracted in a detection target object in a training image each are labeled with a label indicating a class of the detection target object, feature values calculated from a peripheral image area of feature points of a non detection target object in the training image each are labeled with a label indicating the non detection target object, voting positions in a parameter space are calculated by relative positions of the feature points of the detection target object from the detection target object on the training image, and a first classifier is learned using the labeled feature values extracted in the training image so that a class distribution is concentrated and the voting positions in the parameter space are concentrated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.