Patent · US Active

Scratch resistance test methods and apparatus

US8549891B2 · kind B2 · utility

1Cited by
11References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 27, 2010
Grant dateOct 8, 2013
Priority date
Expiry dateAug 25, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N3/46
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The apparatus and methods disclosed may be utilized for the scratch/mar testing of various materials and components that provide improved correlation between the simulated damage modes and those reasonably expected to be encountered by the final components. The apparatus includes both a fixture configured for receiving and holding the material under test (MUT) and a tool holder that is arranged and configured for supporting and holding a variety of test tools in one or more orientations relative to the MUT. The tool holder and/or the fixture are, in turn, supported by one or more assemblies arranged and configured for bringing the tool into contact with the MUT and providing for movement of the tool relative to the MUT. The apparatus is then used for collecting data from a series of tests that can be used to compare the performance of different MUT compositions and configurations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.